PS00xxA 光隔離差動探棒
Testing power converters, inverters, motor drives, and associated evaluation boards.
Evaluating power management ICs for DC-DC converters, voltage regulators, and Battery
Management Systems (BMS).
Galvanically isolated voltage probes separate the Device Under Test (DUT) from the oscilloscope and earth ground, enabling safer and more accurate measurements. This isolation effectively rejects common-mode signals, minimizes noise interference, and eliminates ground loops in high-voltage environments. A high Common-Mode Rejection Ratio (CMRR) is essential for capturing small signals accurately, even in the presence of large common-mode voltages at floating nodes. The CMRR of an isolated probe can be over 100 million times greater than that of a standard differential voltage probe referenced to earth ground.
Applications
Isolated probes offer significant benefits across multiple industries and applications. Most commonly used in power electronic full-bridge and half-bridge architectures, they enhance efficiency and performance testing of fast-switching devices such as wide bandgap GaN and SiC semiconductors. With support for high-voltage differential measurements up to ±2,500 V and the ability to reject common-mode signals up to ±60,000 V, isolated probes play a critical role in applications like automotive Electric Vehicle (EV) testing and photovoltaic solar power conversion.
Applications
Isolated probes offer significant benefits across multiple industries and applications. Most commonly used in power electronic full-bridge and half-bridge architectures, they enhance efficiency and performance testing of fast-switching devices such as wide bandgap GaN and SiC semiconductors. With support for high-voltage differential measurements up to ±2,500 V and the ability to reject common-mode signals up to ±60,000 V, isolated probes play a critical role in applications like automotive Electric Vehicle (EV) testing and photovoltaic solar power conversion.
Model information
Probes
PS0004A Optically isolated differential probe, 350 MHz, 2-meter
PS0006A Optically isolated differential probe, 700 MHz, 2-meter
PS0008A Optically isolated differential probe, 1 GHz, 2-meter
Probe tips
PS0017A Probe tip, ±10 V, MMCX
PS0018A Probe tip, ±30 V, MMCX
PS0019A Probe tip, ±250 V, MMCX
PS0022A Probe tip, ±10 V, 100 mil pitch, 0.025” square pin socket
PS0023A Probe tip, ±100 V, 100 mil pitch, 0.025” square pin socket
PS0025A Probe tip, ±500 V, 100 mil pitch, 0.025” square pin socket
PS0027A Probe tip, ±1000 V, 200 mil pitch, 0.025” square pin socket
PS0028A Probe tip, ±2500 V, 200 mil pitch, 0.025” square pin socket
Accessories
PS0013-64701 Bipod (included with each probe)
8710-2466 SMA wrench (included with each probe)
PS0010A Basic connectivity kit
PS0014A Isolated probe adapter for 3D probe positioner (N2787A)
PS0015A Probe deskew and performance verification kit with MMCX
Probes
PS0004A Optically isolated differential probe, 350 MHz, 2-meter
PS0006A Optically isolated differential probe, 700 MHz, 2-meter
PS0008A Optically isolated differential probe, 1 GHz, 2-meter
Probe tips
PS0017A Probe tip, ±10 V, MMCX
PS0018A Probe tip, ±30 V, MMCX
PS0019A Probe tip, ±250 V, MMCX
PS0022A Probe tip, ±10 V, 100 mil pitch, 0.025” square pin socket
PS0023A Probe tip, ±100 V, 100 mil pitch, 0.025” square pin socket
PS0025A Probe tip, ±500 V, 100 mil pitch, 0.025” square pin socket
PS0027A Probe tip, ±1000 V, 200 mil pitch, 0.025” square pin socket
PS0028A Probe tip, ±2500 V, 200 mil pitch, 0.025” square pin socket
Accessories
PS0013-64701 Bipod (included with each probe)
8710-2466 SMA wrench (included with each probe)
PS0010A Basic connectivity kit
PS0014A Isolated probe adapter for 3D probe positioner (N2787A)
PS0015A Probe deskew and performance verification kit with MMCX